Material Characterization - SEM & FTIR

Material Characterization - SEM & FTIR

University

15 Qs

quiz-placeholder

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Material Characterization - SEM & FTIR

Material Characterization - SEM & FTIR

Assessment

Quiz

Physics

University

Medium

Created by

Azianty Saroni

Used 32+ times

FREE Resource

15 questions

Show all answers

1.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

What does SEM stand for?

Survey Electron Microscope

Soft Electron Microscope

Scanning Electron Microscope

Scattered Electron Microscope

2.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

What is the source of SEM to scan the sample?

Light

Electron

Proton

3.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

What is the purpose to study the SEM images?

To understand the structural properties of the material - surface morphology

To understand the physical properties of the material - surface morphology

4.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

What is the used of magnetic lens in the working principle of SEM?

Bring the electron to scatter

Bring the electron to focus

Bring th electron to diverge

5.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

The .......... is the often detection of SEM imaging used to analyse the material.

X-ray

Back scattered electron

Secondary electron

6.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

The signal from secondary electron define as the ........

interaction of the electron beam with atoms at or near to the surface of the material

interaction of the electron beam with atoms at depth ~ 500 μm

interaction of the electron beam with atoms outside the surface of the material

7.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

To ensure the imaging result is correct and good, the sample are required to

glass

non conductive

electrically conductive

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