Microscopy and XRD Quiz

What does AFM stand for?

• Atomic Field Microscopy

• Advanced Force Microscopy

• Atomic Force Microscopy

• Atomic Friction Microscopy

Which principle is XRD based on?

• Snell's Law

• Bragg's Law

• Hooke's Law

• Ohm's Law

What is the primary purpose of SEM?

• Analyze chemical composition

• Study internal crystal defects

• Obtain high-resolution surface images

• Measure electrical conductivity

In AFM, what detects the deflection of the cantilever?

• Magnetic coils

• Laser beam and photodiode detector

• Piezoelectric sensor

• Capacitive sensor

What does XRD primarily analyze?

• Surface topography

• Crystal structure and phase composition

• Elemental composition

• Magnetic properties

Which is NOT a mode of AFM operation?

• Contact mode

• Non-contact mode

• Reflection mode

• Tapping mode

Why does SEM have higher resolution than optical microscopy?

• Uses higher magnification lenses

• Electrons have shorter wavelengths than visible light

• Operates in a vacuum environment

• Relies on digital image processing

Which electrons are primarily detected in SEM for surface imaging?

• Backscattered electrons

• Secondary electrons

• Auger electrons

• Characteristic X-rays

Which is a common AFM application?

• Bulk elemental analysis

• Measuring surface roughness

• Identifying crystal defects

• Determining electrical resistivity