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WorksheetsNE FIRST SERIES
Total questions: 15
Worksheet time: 9mins
Distance covered by an electron between two inelastic collision is called as -------------
(a)
which type of imaging will give the information related to the chemistry of the sample under investigation
BSE
SECONDARY ELECTRON
TEM
X-RAY & AUGER ELECTRON
Microscopic technique used to find melting point of nano crystals?
SEM
TEM
STM
AFM
OF the below given IMAGING techniques which one is called as true surface imaging technique?
SEM
TEM
AFM
XRD
In STM ----------------- between the probe and substrate is measured
(a)
Atomic number contrast between the regions of specimen can be identified by---------------------------- image
(a)
Magnification range of SEM is ------------------
(a)
In --------------------- mode of operation , AFM will provide improved imaging in fluids.
(a)
STM was developed by -----------------------------
(a)
Darker and lighter areas of TEM imagery denotes --------------------------& ------------------------- respectively
(a)
out of the given microscopic techniques which will require more time for sample preparation
optical microscope
SEM
TEM
STM
Spatial resolution of STM in x,y &z directions are --------,------- & -------- respectively
(a)
a quantum well is represented by
λ>Lx, Ly & Lx, Ly<<Lz
λ>> Lx, Ly,Lz
λ>Lx & Lx <<Ly,Lz
λ<<Lx, Ly,Lz
The process in which hetero epitaxial film is grown vertically and horizontally at the same time is called as----------
(a)
The process of emission of light , when atoms excited by high energy electron return to their ground state is called as ----------------------
(a)
