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WorksheetsAFM SMILER Exercise 1-4
Total questions: 10
Worksheet time: 5mins
Consider a uniform rectangular cantilever subject to a positive vertical load pointing upwards at its free end (like an AFM tip being pushed up by the sample), which location has the maximum strain within the cantilever material?
Top surface at the fixed end of the cantilever
Center line at the fixed end of the cantilever
Top surface at the free end of the cantilever
Bottom surface at the middle of the cantilever
Which of the following changes will result in the most significant increase of cantilever stiffness (assuming all other parameters remain unchanged)?
Double the Young’s modulus of the material
Increase the width from W to 4W
Increase the thickness from T to 2T
Decrease the length L to L/3
For cantilever analysis, what does the fix end boundary condition implies?
The shear force is zero
The moment is zero
The vertical deflection is zero
The internal strain is zero
Which subsystem of the educational AFM moves to achieve probe-sample engagement?
Coarse positioner
Signal processing circuit
NI myRIO
Buzzer-actuated scanner
Which component interfaces with the active cantilever probe directly to convert piezoresistor value change to voltage signal?
Wheatstone bridge amplifier
NI myRIO
Signal processing circuit
Buzzer scanner driver circuit
Which scanning mode in the simulator is the cantilever resonance oscillation excited?
Pinpoint location mode
Constant force mode
Constant height mode
Dynamic tapping mode
Which scanning pattern is utilized in the constant force mode for virtual imaging?
Linear raster scan
Spiral pattern scan
Lissajous pattern scan
Wood pecking scan
For the quadrature photodiode laser alignment, which of the following statement is true?
The vertical signal should be maximized
The horizontal signal should be maximized
The sum signal should be maximized
The sum signal should be set close to 0
In the system, there are two sets of coarse XY manual positioners. What does the XY positioner on the very bottom do?
Move cantilever probe around to align with laser
Move relative position between optical microscope and AFM system
Move relative position between the cantilever probe and the sample
Move the reflected laser to align with the quadrature photodiode
Which of the following step is absolutely necessary before optimizing signals on the quadrature photodiode?
Load the sample on the sample stage
Bring the sample area of interest into the optical microscope view
Engage probe and sample
Focus laser on the cantilever
