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20EC214 - QUIZ-2

Total questions: 10

Worksheet time: 3mins

Name
Class
Date
1.

The temporal variation of the clock period at a given point that is clock period is expand or reduce on a cycle by cycle is refered as ___________

a)

Clock Skew

b)

Clock rate

c)

Clock jitter

d)

None of the above

2.

The clock skew can be positive or negative depending upon the ___________ and
____________ of the clock source.

a)

level of spatial variation and position

b)

routing direction and position

c)

phase of the spatial variation and direction

d)

phase of the spatial variation and position

3.

Which is not a sources of clock skew and jitter?

a)

Clock Signal Generation

b)

Manufacturing Device Variations

c)

Interconnect Variations

d)

Device Scaling

4.

In most high-speed digital processors, a major-
ity of the power is dissipated in the _______________.

a)

Switching

b)

Clock Network

c)

Device Ideal Condition

d)

All the Above

5.

Latch Based designs are preferred in case of clock frequency in ______

a)

KHz

b)

MHz

c)

GHz

d)

THz

6.

The logical ordering of the operations is ensured by the acknowledge-request scheme __________

a)

handshaking protocol

b)

Simple Mail Transfer Protocol

c)

Challenge-Handshake Authentication Protocol

d)

Dial-up Internet Access

7.

The four events proceed in a cyclic order in the process of self timed signalling are ________

a)

data change

b)

request

c)

data acceptance

d)

All the above

8.

An asynchronous signal must be resolved to be either in the high or low state before it is fed into the synchronous environment. A circuit that implements such a decision making function is called a ___________

a)

Arbiters

b)

Synchronizers

c)

Loop Filter

d)

XOR Phase Detectors

9.

Which is not an building block of PLL?

a)

VCO

b)

Phase Detector

c)

Arbiters

d)

Phase Frequency Detector

10.

The connection of synchronous and asynchronous components introduces the risk of ____

a)

synchronization failure

b)

Acceptable Failure

c)

Mean time to failure

d)

instantaneous failure