ATS 2024: Track 2

ATS 2024:
Track 2

Multiple Choice

Paper: Improving PreHVS Sidd Yield Loss via Optimization of GIDL-Related Process Parameters in 3nm

Question: Which leakage component is dominant at high voltage presented in this work?

• Isub-th

• Igidl

• Ijunction

• Itunnel

Multiple Choice

Paper: 7nm Versal Automotive Qualification & Enablement

Question: How many Versal AI Edge devices offer for Automotive?

• 5

• 6

• 7

• 8

Multiple Choice

Paper: Legacy Resurgence: Framework For Achieving Vertical Revenue Take-Off

Question: Choose the 2 correct manufacturing flow optimization with speed prediction

• FT2 Skip and Increase Upfront Marking

• Backend Marking Skip and FT2 test time reduction

• FT2 Skip and FT2 test time reduction

• FT2 Skip and Backend Marking Skip

Multiple Choice

Paper: OBP PRISM DPPM Improvement

Question: What does PRISM stand for?

• Precision, Reliability, Inclusivity, Systematic, Minimally

• Precision, Robust, Innovative, Systematic, Minimally

• Precision, Reliability, Innovative, Systematic, Minimally

• Power, Reliability, Innovative, Systematic, Minimally

Multiple Choice

Paper: Giga-Transceiver Functional Pattern Test-Time Reduction (TTR)

Question: In Production screen, what is the approximated optimized wait time for RX CDR to settle after attribute configuration?

• 50ms

• 100ms

• 200ms

• 300ms

Multiple Choice

Paper: 7nm IP Block Defect Density Normalization and Implementation for Silicon Yield Improvement

Question: Name the Defect Density Model used for Block DD Computation

• Murphy model

• Bose Einstein Model

• Poisson Model

• None of the above

Multiple Choice

Paper: SCAN Yield Improvement for AI Chip by Optimizing SRAM RM Timing

Question: Which RM settings implemented for Scan VMAX test?

• 000

• 001

• 101

• 111

Multiple Choice

Paper: Ameliorating Pre & Post Silicon Validation Methods for Multi-Die Packages with Multi JTAG Interfaces

Question: In Salina 375, Which die is assigned as the Master TAP?

• Die 0

• Die 1

• No designated master die

• Die with address strap 0x00D

Multiple Choice

Paper: Next-Generation Automotive Solutions: Enabling 7nm WS at 125°C

Question: What strategy was applied in this paper?

• Shift Right Moving in Manufacturing

• Shift Left Moving in Manufacturing

• Shift Right Testing in Manufacturing

• Shift Left Testing in Manufacturing

Multiple Choice

Paper: Improving PreHVS Sidd Yield Loss via Optimization of GIDL-Related Process Parameters in 3nm

Question: Which process parameter could affect GIDL and is newly discovered at this work?

• FinCD

• Gox Thickness

• S/D Proximity

• Poly Footing