VLSI Testing - Quiz 1

____________ is a physical defect that may or may not cause a failure.

• Simulation

• Fault

• Testing

• VLSI

The most common model used for logical faults is _______________________.

• Stuck-at Fault

• Bridging Fault

• Stuck-Open Fault

• Stuck-CloseFault

This is not the category of Bridging Fault.

• Input Bridging

• Output Bridging

• Feedback Bridging

• Non-feedback Bridging

__________ break occurs internal to a gate.

• Intragate

• Immediate

• Signal line

• Temporary

_______________ fault implies the permanent closing of the path between the source and the drain of the transistor.

• Bridging

• Stuck-open

• Stuck-on

• Delay

_______________ fault implies the permanent opening of the path between the source and the drain of the transistor.

• Bridging

• Stuck-open

• Stuck-on

• Delay

Identify the types of delay faults:

• Gate Delay Fault

• Path Delay Fault

• Fan-out Fault

• PODEM

______________ are nonrecurring faults temporary faults.

• Intermittent Fault

• Transient Fault

• Active Fault

• Stuck-at Fault

Intermittent Faults occur due to

• Alpha Particle Radiation

• Loose Connection

• Partially Defective Components

• Environmental Conditions

______________ is the compact version of the truth table.

• Singular Cover

• D-Algorithm

• Boolean Difference

• Primitive D-Cube