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Testing

Authored by Mrs. sam

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Testing
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10 questions

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1.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

--process to verify the behavior, performance, and reliability of a device or system against designed specifications.

Testing

DUT

Synthesis

Simulation

2.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

Decreasing -----increases probability of defects during manufacturing process

transistor

feature size

resistance

reliability

3.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

Identify the IC chip Package

Pin Graphic Array Package

Sphere Grid Array Package

Dual-In-Line Package

Lead carry Package

4.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

-- verifies the correctness of design

Failures

Fault

Testing

Verification

5.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

A wrong output signal produced by a defective system is called an -------

error

fault

design

failure

6.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

--- further decomposes blocks into logic gates.

Logic design

Physical design

Functional Design

Architectural Design

7.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

Physical layout is converted into ---- that are directly used in the fabrication of silicon VLSI chips

silicon masks

photo masks

electron masks

proton masks

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