Testing

--process to verify the behavior, performance, and reliability of a device or system against designed specifications.

• Testing

• DUT

• Synthesis

• Simulation

Decreasing -----increases probability of defects during manufacturing process

• transistor

• feature size

• resistance

• reliability

Identify the IC chip Package

• Pin Graphic Array Package

• Sphere Grid Array Package

• Dual-In-Line Package

• Lead carry Package

-- verifies the correctness of design

• Failures

• Fault

• Testing

• Verification

A wrong output signal produced by a defective system is called an -------

• error

• fault

• design

• failure

--- further decomposes blocks into logic gates.

• Logic design

• Physical design

• Functional Design

• Architectural Design

Physical layout is converted into ---- that are directly used in the fabrication of silicon VLSI chips

• silicon masks

• photo masks

• electron masks

• proton masks

-- uses different test types, including examination through optical and electron microscopes, to determine the  failure cause and fix the process

• FMA

• SDA

• FGD

• PHR

-- is the lowest level of abstraction

• Simulation Level

• Physical Level

• Logic Level

• Register Level

The system consists of ----

• levels and designs

• design and levels

• levels and abstractions

• Data  and Control parts