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WorksheetsMaterial Characterization - SEM & FTIR
Total questions: 15
Worksheet time: 8mins
What does SEM stand for?
Survey Electron Microscope
Soft Electron Microscope
Scanning Electron Microscope
Scattered Electron Microscope
What is the source of SEM to scan the sample?
Light
Electron
Proton
What is the purpose to study the SEM images?
To understand the structural properties of the material - surface morphology
To understand the physical properties of the material - surface morphology
What is the used of magnetic lens in the working principle of SEM?
Bring the electron to scatter
Bring the electron to focus
Bring th electron to diverge
The .......... is the often detection of SEM imaging used to analyse the material.
X-ray
Back scattered electron
Secondary electron
The signal from secondary electron define as the ........
interaction of the electron beam with atoms at or near to the surface of the material
interaction of the electron beam with atoms at depth ~ 500 μm
interaction of the electron beam with atoms outside the surface of the material
To ensure the imaging result is correct and good, the sample are required to
glass
non conductive
electrically conductive
The study of Infrared spectroscopy is use to
identify the chemical properties
identify the physical properties
identify the structural properties
What does FTIR stand for?
Fourier Transform Invisible Region
Four Technique Infrared Region
Fourier Transform Infrared Region
Four Technique Invisible Region
The dependent variable on an IR spectra is
wavelength
frequency squared
wave number
transmission
The independent variable on an IR spectra is
wavelength
frequency squared
wave number
transmission
What part of the atom or molecule does infrared radiation affect?
the nucleus
the bonds
the electron
the charge
The Infrared region have a ........
shorter wavelength, lower frequency
longer wavelength, higher frequency
shorter wavelength, higher frequency
longer wavelength, lower frequency
The fact of Fourier transform is a mathematical process to ......
convert the big data to actual spectrum
convert raw data to big data
convert raw data to actual spectrum
FTIR can be used as a failure analysis to identify the unknown material present in the sample and usually conducted complimentary with ......... analysis.
X-ray diffraction (XRD)
Energy Dispersive X-Ray (EDX)
Scanning Electron Microscope (SEM)
