WorksheetsME6601 L12 Revision
Total questions: 20
Worksheet time: 20mins
Q1. Which of the following is a primary objective of materials characterization?
A) To synthesize new materials
B) To measure and analyze material properties
C) To increase manufacturing speed
D) To develop automation in engineering
Q2. Which of the following is/are non-destructive characterisation methods?
A) X-Ray diffraction (XRD)
B) Scanning Electron Microscopy (SEM)
C) Transmission Electron Microscopy (TEM)
Atom Probe Tpmography (APT)
Q3. Which of the following is/are common objectives of engineering metrology?
A) Improving precision of measurements
B) Extending product lifespan
C) Reducing variability in manufacturing
D) Enhancing visual appearance
Q4. When a set of readings of a measurement has a wide range, it indicates
A) High precision
B) High accuracy
C) Low precision
D) Low accuracy
Q5. Calibration of metrological instruments ensures:
A) Instrument accuracy
B) Consistent results over time
C) Increased measurement speed
D) Safety of the device
Q6. Laser scanning confocal microscopy is commonly used in which fields?
A) Biomedical sciences
B) Metallurgical engineering
C) Structural dynamics
D) Surface engineering
Q7. Which of the following is/are advantages of Laser Scanning Confocal Microscopy (LSCM)?
A) High depth resolution
B) Low sample preparation requirements
C) Non-contact imaging
D) Real-time 3D imaging of bulk samples
Q8. Digital Image Correlation is commonly used to measure:
A) Displacement fields
B) Strain distribution
C) Surface temperature
D) Electrical properties
Q9. DIC is useful in applications involving:
A) Deformation analysis
B) Tensile testing
C) Thermal expansion monitoring
D) Magnetic property measurements
Q10. XRD is primarily used to determine:
A) Crystal structure
B) Surface roughness
C) Phase composition
D) Material hardness
Q11. Which types of materials can be analyzed using XRD?
A) Metals
B) Polymers
C) Ceramics
D) Liquids
Q12. Scanning Electron Microscopy can be used to obtain information on:
A) Sample surface topography
B) Material composition
C) Atomic structure
D) Crystal orientation
Q13. SEM images are produced by:
A) Secondary electrons
B) Backscattered electrons
C) Fluorescent photons
D) X-rays
Q14. Which of the following that TEM can be used for?
A) Imaging at atomic resolution
B) Identifying crystal defects
C) Surface topography analysis
D) Elemental mapping with EDS
Q15. Which of the following techniques provides information about molecular vibrations and chemical bonds in materials?
A) Raman Spectroscopy
B) FTIR
C) Both A and B
D) Scanning Electron Microscopy (SEM)
Q16. Which of the following can be analyzed using both Raman and FTIR?
A) Crystal lattice structure
B) Vibrational modes of molecules
C) Atomic composition
D) Chemical bonding in materials
Q17. Which of the following factors can affect the lateral resolution of Atomic Force Microscopy (AFM)?
A) Tip radius of curvature
B) Scan speed
C) Sample stiffness
D) Cantilever spring constant
Q18. Which of the following is/are advantages of AFM?
A) High resolution in three dimensions
B) Non-destructive, contact-based measurement
C) Requires the sample to be conductive
D) Ability to measure forces between atoms
Q19. Which of the following is/are capabilities of Atom Probe Tomography (APT)?
A) 3D imaging of atomic-scale structures
B) Elemental mapping of materials
C) Imaging surface roughness
D) Measuring the elastic properties of materials
Q20. Which of the following is/are the key differences between AFM and APT?
A) AFM measures surface morphology, while APT analyzes chemical composition in 3D
B) APT provides atomic-level resolution for both composition and structure
C) AFM can measure mechanical properties, but APT cannot
D) APT is a non-destructive technique, whereas AFM is destructive
