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CHM3402_Revisions_Other spectroscopic techniques

Total questions: 20

Worksheet time: 9mins

Name
Class
Date
1.

Which of the following is the primary difference between SEM and TEM?

a)

SEM uses light while TEM uses electrons

b)

SEM provides 2D images, TEM provides 3D images

c)

SEM scans the surface; TEM transmits electrons through the specimen

d)

TEM uses X-rays; SEM uses visible rays

2.

In SEM, what type of electrons are mainly used to form the image?

a)

Transmitted electrons and inelastic scattering

b)

Backscattered electrons and secondary electrons

c)

Auger electrons and backscattered electron

d)

Characteristic X-rays

3.

What kind of sample preparation is typically required for TEM compared to SEM?

a)

Coating with gold only

b)

No sample preparation needed

c)

Thin sectioning can be up to 500 nm for TEM samples but SEM sample must be thin

d)

Thin sectioning for TEM sample cannot be thicker than 200 nm

4.

Which technique typically requires a vacuum environment for imaging?

a)

Light microscopy only

b)

Both SEM and TEM

c)

TEM only

d)

SEM only

5.

Which microscopy technique is better suited for imaging internal structures at atomic resolution?

a)

SEM

b)

TEM

c)

XPS

d)

EDX

6.

What type of image is typically produced by a TEM?

a)

3D surface topography

b)

Depth profile

c)

2D internal structural image

d)

Color-enhanced micrograph

7.

Which of the following signals is NOT used in TEM but is common in SEM?

a)

Secondary electrons

b)

Transmitted electrons

c)

Electron diffraction

d)

elastic scattering electron

8.

Which technique is more suitable for viewing surface morphology?

a)

X-ray image

b)

TEM

c)

Light microscopy

d)

SEM

9.

What is the primary purpose of using EDX in SEM or TEM?

a)

To obtain high-resolution images

b)

To analyze the crystal structure

c)

To measure the sample's thickness

d)

To identify the elemental composition of a sample

10.

In which instrument is EDX more commonly used due to ease of sample handling and setup?

a)

TEM

b)

SEM

c)

XRD

d)

Raman

11.

Which of the following elements is typically not well detected by EDX?

a)

Carbon (C)

b)

Iron (Fe)

c)

Copper (Cu)

d)

Gold (Au)

12.

What is a common application of TEM in the field of nanotechnology?

a)

Surface roughness profiling

b)

Imaging nanoparticles and their internal structure at atomic resolution

c)

Detecting optical properties of nanomaterials

d)

Measuring electrical conductivity

13.

SEM is particularly useful in forensic science for which of the following reasons?

a)

DNA sequencing

b)

Determining isotopic composition

c)

Analyzing fracture surfaces and gunshot residues

d)

Amplifying genetic material

14.

What kind of light is typically used in Raman spectroscopy?

a)

X-rays

b)

Infrared light

c)

Ultraviolet radiation

d)

Monochromatic visible or near-infrared laser light

15.

Which of the following is a key advantage of Raman spectroscopy over infrared (IR) spectroscopy?

a)

Raman can analyze aqueous samples easily

b)

Raman requires a vacuum

c)

Raman needs more sample preparation

d)

IR is more sensitive to symmetrical molecules

16.

In Raman spectroscopy, a Stokes line occurs when the scattered photon has (a)   energy than the incident photon.

17.

The difference in energy or frequency between the incident light and the scattered light in Raman spectroscopy is called the (a)   scattering.

18.

Stokes and anti-Stokes lines in Raman spectroscopy refer to:

a)

Different types of laser sources

b)

Different types of detectors

c)

Energy loss and gain during scattering

d)

Types of polarizations

19.

The component that generates the electron beam in both SEM and TEM is called the (a)   .

20.

In (a)   emission sources, electrons are emitted when the filament is heated to a high temperature.