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Quiz on Unit-II

Total questions: 10

Worksheet time: 3mins

Name
Class
Date
1.

Which method is commonly used to slice silicon ingots into wafers?

a)

Laser cutting

b)

Wire sawing

c)

Plasma etching

d)

Chemical etching

2.

What is the main purpose of wafer edge rounding?

a)

Reduce wafer thickness

b)

Increase wafer conductivity

c)

Prevent wafer cracks and chipping

d)

Improve optical properties

3.

In RCA cleaning, SC-1 solution primarily removes:

a)

Organic contaminants and particles

b)

Metal ions

c)

Native oxide

d)

Surface scratches

4.

Which chemical mixture is used in SC-2 cleaning?

a)

NH₄OH + H₂O₂ + H₂O

b)

HCl + H₂O₂ + H₂O

c)

HF + H₂O

d)

HNO₃ + H₂O

5.

Megasonic cleaning is preferred over ultrasonic cleaning because:

a)

It is faster

b)

It uses higher frequency and causes less wafer damage

c)

It requires less water

d)

It removes metal ions

6.

The main objective of Chemical Mechanical Polishing (CMP) is to:

a)

Increase wafer thickness

b)

Remove metallic contaminants

c)

Achieve a flat, smooth wafer surface

d)

Etch patterns on wafer

7.

Which of the following is NOT a component in CMP?

a)

Polishing pad

b)

Slurry

c)

Downforce

d)

Laser beam

8.

Optical wafer inspection is mainly used to detect:

a)

Subsurface voids

b)

Surface scratches and particles

c)

Crystalline defects

d)

Wafer thickness variations

9.

Infrared (IR) inspection is effective because silicon:

a)

Reflects UV light

b)

Is opaque to visible light but transparent to IR

c)

Conducts heat well

d)

Absorbs X-rays strongly

10.

Which parameter is measured using surface profilometry?

a)

Electrical resistivity

b)

Flatness and roughness

c)

Optical transparency

d)

Thermal conductivity