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WorksheetsFundamentals of Digital Testing 3
Total questions: 20
Worksheet time: 10mins
What are the purposes of Device Char?
To find limits where the device will fail
to find abnormalities in the shmoo plots
to find ROI on the binsplit data
All of them
What is the type of this search?
linear
exponential
binary
logarithm
Which one is true for VIL search in digital IC?
The higher the Vdd the lower will be the VIL max
The higher the Vdd the higher will be the VIL max
The higher the Vdd makes no change on the VIL
The lower the Vdd makes the Vil higher
What is this call?
A hole in a shmoo
passing region in a shmoo
pocket defects in an IC
all of them
Which is correct for this datalog?
Mary made mistakes because the currents are negatives
the shorts are tested parallelly
This test run on upper protection diodes
none is correct
These are all the output pin searches on one parameter. What is the best description?
This is the setup time
This is the hold time
This is the propagation delay
min pulse width
This is one of the characterization measurements run on a processor ,what is LFM?
length pressure per meter
load pascal per minute
linear flow per meter
line feet per minute
Which is important in debugging?
Tester
Test program
Unit
all of them
Ah Kaw open an icon in a test program flow. What will be the best test for this one?
opens
shorts
leakage
Vih
These are the reasons for DFT except ...
Testing cost
Time to market
simplify testing process
extend the life-span of a product
What is this defect?
fab defects
reeling defects
bonding defects
packaging defects
What is the meaning of "Controllability" in DFT?
ability to control the internal state of an IC
ability to manipulate the output states
ability to change the IC structures
none is correct
What is observability in DFT?
all are correct
ability to observe internal state of a circuits thru the inputs and outputs
ability to observe internal state of a circuits thru the inputs
ability to observe internal state of a circuits thru the outputs
what is this circuit?
it is a bscan cell on one node
it is a bscan cell on 2 nodes
it is a bscan cell on 3 nodes
None is correct
Which one is not true about JTAG BSCAN?
is an extension of bscan test
also known as 1150.1
it has 5 IO signals
it capable of checking interconnection between devices
What is the main role of TDI pin in JTAG bscan?
to receive all the data send to JTAG network
to send data out of JTAG network
to control the TAP controller
to return the state machine of the TAP
These are the functions of the Instruction register in JTAG BSCAN except ...
to control the selection of the bypass register
to select the boundary scan register
to select the data register
to reset JTAG network
TMS timing is "0111" on each of TCLK. What is your TAP state machine?
Test logic reset
run test idle
select dr-scan
select ir-scan
Your TMS is "01101011" on each of TCLK in JTAG BSCAN. What is your TAP state machine?
Update-DR
Update-IR
Exit2-DR
Exit2-IR
What is the disadvantage of bist?
need to add more circuitry
save testing cost
lower repair time
to extend the life-span of a product
